EB-112 Semiconductor Fundamentals 2
Innovative Technologies in Education (ITE)
EB-112 Semiconductor Fundamentals 2
The EB-112 is a single board comprehensive instructional module
designed to teach advanced concepts of Semiconductor Fundamentals
to technology students. The module can be operated as a stand-alone
unit or integrated to the newly developed EB-2000 Computer Managed
Laboratory.
The module contains experimental circuits with which the student
performs a number of conceptual experiments at various levels of
difficulty. Manual or computer driver fault-finding exercises and
testing are available when the module is interconnected to the EB-2000
system, providing valuable experience in the training and diagnosis
of faults. Test equipment, when used, attaches to the board via
2mm jacks, placed at various points around the circuits. Students
are required to do only a minimal amount of wiring so training time
is maximised. A comprehensive student manual is provided with each
training module. The manual correlates to the exercises to convey
concepts relating to the technologies covered, allowing focus on
specific performance objectives.
DESCRIPTION
The EB-112 module is designed so that students spend the maximum
time on the experiments and practice drills for testing comprehension
and troubleshooting. The PCB has the dimensions 234.5x200mm. For
operation the module is connected to an external power supply or
it is plugged in the PU-2000, PU-20O1 or PU-2002 main frame. To
facilitate the exercises, all the major signals are brought out
on-board with 2mm jacks for tests and interconnections. The ICs
and the transistors are mounted on sockets, enabling easy replacement.
The student has only to plug-in the appropriate patching cords and
shorting plugs in order to perform the recommended experiments.
The boards also come equipped with "black boxes" containing
components used in the fault-finding and practice modes, components
that should not be visually identified by the trainee.
OBJECTIVES
Plot the drain characteristic curves from measured values.
Plot the transfer characteristic curve from measured values.
Determine the channel resistance (RDS) from measured values.
Connect the FET in an attenuator circuit.
Determine the transconductance of the FET from measured values.
Measure the DC values in the FET amplifier circuit.
Determine the frequency response from measured values.
Determine how a change in the load resistor changes the voltage
gain.
Plot the drain characteristic curves of the VMOS FET from measured
values.
Connect the VMOS FET as a digital switch then determine the switching
characteristics.
Connect the VMOS FET as an analog switch then determine the switching
characteristics.
Determine the characteristics of a thyristor (SCR).
Connect the thyristor to obtain forward conduction.
Determine the holding current.
Determine the triggering voltage and current.
Measure the firing angle in a phase control circuit
Measure the output voltage of a variable power supply that uses
the phase control of a thyristor.
Use the oscilloscope to determine the firing angle of the triac
when it is connected in the phase shift triggering circuit.
Measure the voltages in the triac circuit.
Sketch the waveforms in the triac circuit.
Determine the voltages and waveform of an operating circuit.
Test the various stages in a circuit and locate the faulty stage.
Locate the fault within the stage of a circuit.
RECOMMENDED EXPERIMENTS
Field effect transistor characteristics.
FET amplifier
VMOS FET
Thyristors
Triac
Troubleshooting
REQUIRED ACCESSORIES
DL-20 Standard set of 2mm Patching Cords and Shorting Plugs
RECOMMENDED ACCESSORIES (for working with EB-2000)
PU-2OOO – Main Frame (Replaceable by PU-2001 or PU-2002)
MB-U – Rack Unit With Power Supply.
REQUIRED MEASURING EQUIPMENT
20MHZ Dual Trace Oscilloscope
Digital Multimeter 3-1/2 Digits
2.2MHZ AM/FM Function T Generator
MANUAL
Student and instructor manuals, written by pedagogues and electronics
professionals, support every stage of the learning and teaching
process.
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